179 entries « 9 of 9 »

2007

Feliciano Giustino; Marvin L Cohen; Steven G Louie

Electron-phonon interaction using Wannier functions Journal Article

In: Physical Review B, vol. 76, pp. 165108, 2007.

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Julien Godet; Feliciano Giustino; Alfredo Pasquarello

Proton-induced fixed positive charge at the Si(100)-SiO2 interface Journal Article

In: Physical Review Letters, vol. 99, pp. 126102, 2007.

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Fabien Devynck; Feliciano Giustino; Peter Broqvist; Alfredo Pasquarello

Structural and electronic properties of an abrupt 4H-SiC(0001)/SiO2 interface model: Classical molecular dynamics simulations and density functional calculations Journal Article

In: Physical Review B, vol. 76, pp. 075351, 2007.

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Cheol-Hwan Park; Feliciano Giustino; Marvin L Cohen; Steven G Louie

Velocity renormalization and carrier lifetime in graphene from the electron-phonon interaction Journal Article

In: Physical Review Letters, vol. 99, pp. 086804, 2007.

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Feliciano Giustino; Jonathan R Yates; Ivo Souza; Marvin L Cohen; Steven G Louie

Electron-phonon interaction via electronic and lattice Wannier functions: Superconductivity in boron-doped diamond reexamined Journal Article

In: Physical Review Letters, vol. 98, pp. 047005, 2007.

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2006

Feliciano Giustino; Alfredo Pasquarello

Mixed Wannier-Bloch functions for electrons and phonons in periodic systems Journal Article

In: Physical Review Letters, vol. 96, pp. 216403, 2006.

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2005

Feliciano Giustino; Alfredo Pasquarello

Infrared spectra at surfaces and interfaces from first principles: Evolution of the spectra across the Si(100)-SiO2 interface Journal Article

In: Physical Review Letters, vol. 95, pp. 187402, 2005.

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Feliciano Giustino; Angelo Bongiorno; Alfredo Pasquarello

Atomistic models of the Si(100)-SiO2 interface: structural, electronic and dielectric properties Journal Article

In: Journal of Physics: Condensed Matter, vol. 17, no. 21, pp. S2065–S2074, 2005.

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Feliciano Giustino; Alfredo Pasquarello

Theory of atomic-scale dielectric permittivity at insulator interfaces Journal Article

In: Physical Review B, vol. 71, pp. 144104, 2005.

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Feliciano Giustino; Angelo Bongiorno; Alfredo Pasquarello

Equivalent oxide thickness of a thin oxide interlayer in gate insulator stacks on silicon Journal Article

In: Applied Physics Letters, vol. 86, no. 19, pp. 192901, 2005.

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Fabien Devynck; Feliciano Giustino; Alfredo Pasquarello

Abrupt model interface for the 4H(1000)SiC-SiO2 interface Journal Article

In: Microelectronic Engineering, vol. 80, pp. 38 - 41, 2005, ISSN: 0167-9317.

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Feliciano Giustino; Alfredo Pasquarello

Infrared properties of ultrathin oxides on Si(100) Journal Article

In: Microelectronic Engineering, vol. 80, pp. 420 - 423, 2005, ISSN: 0167-9317.

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Feliciano Giustino; Alfredo Pasquarello

Electronic and dielectric properties of a suboxide interlayer at the silicon–oxide interface in MOS devices Journal Article

In: Surface Science, vol. 586, no. 1, pp. 183 - 191, 2005, ISSN: 0039-6028.

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2004

Feliciano Giustino; Angelo Bongiorno; Alfredo Pasquarello

Electronic structure at realistic Si(100)-SiO2 interfaces Journal Article

In: Japanese Journal of Applied Physics, vol. 43, no. 11B, pp. 7895–7898, 2004.

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Feliciano Giustino; Paolo Umari; Alfredo Pasquarello

Dielectric effect of a thin SiO2 interlayer at the interface between silicon and high-k oxides Journal Article

In: Microelectronic Engineering, vol. 72, no. 1, pp. 299 - 303, 2004.

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2003

Feliciano Giustino; Paolo Umari; Alfredo Pasquarello

Dielectric discontinuity at interfaces in the atomic-scale limit: Permittivity of ultrathin oxide films on silicon Journal Article

In: Physical Review Letters, vol. 91, pp. 267601, 2003.

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2002

J Boch; F Saigne; V Mannoni; F Giustino; R D Schrimpf; L Dusseau; K F Galloway; J Fesquet; J Gasiot; R Ecoffet

Model for high-temperature radiation effects in n-p-n bipolar-junction transistors Journal Article

In: IEEE Transactions on Nuclear Science, vol. 49, no. 6, pp. 2990-2997, 2002.

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J Boch; E Saigne; T Maurel; F Giustino; L Dusseau; R D Schrimpf; K F Galloway; J P David; R Ecoffet; J Fesquet; J Gasiot

Dose and dose-rate effects on NPN bipolar junction transistors irradiated at high temperature Journal Article

In: IEEE Transactions on Nuclear Science, vol. 49, no. 3, pp. 1474-1479, 2002.

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Modeling of Si 2p core-level shifts at Si-(ZrO2)_x(SiO2)_1-x interfaces Journal Article

In: Applied Physics Letters, vol. 81, no. 22, pp. 4233-4235, 2002.

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179 entries « 9 of 9 »