2007 |
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Electron-phonon interaction using Wannier functions Journal Article In: Physical Review B, vol. 76, pp. 165108, 2007. | |
Proton-induced fixed positive charge at the Si(100)-SiO2 interface Journal Article In: Physical Review Letters, vol. 99, pp. 126102, 2007. | |
Structural and electronic properties of an abrupt 4H-SiC(0001)/SiO2 interface model: Classical molecular dynamics simulations and density functional calculations Journal Article In: Physical Review B, vol. 76, pp. 075351, 2007. | |
Velocity renormalization and carrier lifetime in graphene from the electron-phonon interaction Journal Article In: Physical Review Letters, vol. 99, pp. 086804, 2007. | |
Electron-phonon interaction via electronic and lattice Wannier functions: Superconductivity in boron-doped diamond reexamined Journal Article In: Physical Review Letters, vol. 98, pp. 047005, 2007. | |
2006 |
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Mixed Wannier-Bloch functions for electrons and phonons in periodic systems Journal Article In: Physical Review Letters, vol. 96, pp. 216403, 2006. | |
2005 |
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Infrared spectra at surfaces and interfaces from first principles: Evolution of the spectra across the Si(100)-SiO2 interface Journal Article In: Physical Review Letters, vol. 95, pp. 187402, 2005. | |
Atomistic models of the Si(100)-SiO2 interface: structural, electronic and dielectric properties Journal Article In: Journal of Physics: Condensed Matter, vol. 17, no. 21, pp. S2065–S2074, 2005. | |
Theory of atomic-scale dielectric permittivity at insulator interfaces Journal Article In: Physical Review B, vol. 71, pp. 144104, 2005. | |
Equivalent oxide thickness of a thin oxide interlayer in gate insulator stacks on silicon Journal Article In: Applied Physics Letters, vol. 86, no. 19, pp. 192901, 2005. | |
Abrupt model interface for the 4H(1000)SiC-SiO2 interface Journal Article In: Microelectronic Engineering, vol. 80, pp. 38 - 41, 2005, ISSN: 0167-9317. | |
Infrared properties of ultrathin oxides on Si(100) Journal Article In: Microelectronic Engineering, vol. 80, pp. 420 - 423, 2005, ISSN: 0167-9317. | |
Electronic and dielectric properties of a suboxide interlayer at the silicon–oxide interface in MOS devices Journal Article In: Surface Science, vol. 586, no. 1, pp. 183 - 191, 2005, ISSN: 0039-6028. | |
2004 |
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Electronic structure at realistic Si(100)-SiO2 interfaces Journal Article In: Japanese Journal of Applied Physics, vol. 43, no. 11B, pp. 7895–7898, 2004. | |
Dielectric effect of a thin SiO2 interlayer at the interface between silicon and high-k oxides Journal Article In: Microelectronic Engineering, vol. 72, no. 1, pp. 299 - 303, 2004. | |
2003 |
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Dielectric discontinuity at interfaces in the atomic-scale limit: Permittivity of ultrathin oxide films on silicon Journal Article In: Physical Review Letters, vol. 91, pp. 267601, 2003. | |
2002 |
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Model for high-temperature radiation effects in n-p-n bipolar-junction transistors Journal Article In: IEEE Transactions on Nuclear Science, vol. 49, no. 6, pp. 2990-2997, 2002. | |
Dose and dose-rate effects on NPN bipolar junction transistors irradiated at high temperature Journal Article In: IEEE Transactions on Nuclear Science, vol. 49, no. 3, pp. 1474-1479, 2002. | |
Modeling of Si 2p core-level shifts at Si-(ZrO2)_x(SiO2)_1-x interfaces Journal Article In: Applied Physics Letters, vol. 81, no. 22, pp. 4233-4235, 2002. |
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